Electronic thin films

Focus on solutions forcharacterizing and measuring

Suitable for characterizing and measuring the electrical properties of various materials.

Characterizing and measuring electronic thin films
A*STAR
NTU
Huawei
State Grid
Johnson Electric
Tsinghua University
CAS
CAEP
A*STAR
NTU
Huawei
State Grid
Johnson Electric
Tsinghua University
CAS
CAEP

We deliver full-lifecycle solutions for functional materials to empower every step of your innovation.

Whether you focus on R&D and preparation of advanced materials, high-precision analysis of complex dielectric and piezoelectric parameters, or enterprise-grade standardized quality control, our integrated platform meets your demanding requirements.

The backbone of advanced materials research

  • 12+ Year

    Founded in Wuhan in 2013; over a decade of electrical characterization instrumentation

  • 15+%

    Sustained R&D investment in extreme-environment measurement systems

  • 100+ items

    Invention patents across dielectric, piezoelectric, and ferroelectric characterization

  • 10000+ ㎡

    Manufacturing and R&D footprint supporting instruments and global delivery